( en | de | ru )

 

Disambiguation of "Wang, Laung-Terng"

Author of the publication

copydeleteadd this publication to your clipboard
Low-capture-power test generation for scan-based at-speed testing.

, , , , , , and . ITC, page 10. IEEE Computer Society, (2005)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Andy Ch Laungani

Harn-Jing Terng

Terng-Yaw Lin

Wang Wang

Linfang Wang

Investigation of the functions of 53BP1 in DNA demethylation. Uni Marburg, (2009)
 

Other publications of authors with the same name

A Novel ATPG Method for Capture Power Reduction during Scan Testing., , , , , , and . IEICE Trans. Inf. Syst., 90-D (9): 1398-1405 (2007)Turbo1500: Core-Based Design for Test and Diagnosis., , , , , , , , , and 5 other author(s). IEEE Des. Test Comput., 26 (1): 26-35 (2009)Self-Testing of Embedded RAMs., and . ITC, page 148-156. IEEE Computer Society, (1984)Scan Flip-Flop Grouping to Compress Test Data and Compact Test Responses for Launch-on-Capture Delay Testing., , and . ACM Trans. Design Autom. Electr. Syst., 17 (2): 18:1-18:24 (2012)Low-capture-power test generation for scan-based at-speed testing., , , , , , and . ITC, page 10. IEEE Computer Society, (2005)At-Speed Logic BIST for IP Cores., , , , , , , , and . DATE, page 860-861. IEEE Computer Society, (2005)CTX: A Clock-Gating-Based Test Relaxation and X-Filling Scheme for Reducing Yield Loss Risk in At-Speed Scan Testing., , , , , , , and . ATS, page 397-402. IEEE Computer Society, (2008)VirtualScan: Test Compression Technology Using Combinational Logic and One-Pass ATPG., , , , , , and . IEEE Des. Test Comput., 25 (2): 122-130 (2008)Testing of Synchronizers in Asynchronous FIFO., , , and . J. Electron. Test., 29 (1): 49-72 (2013)CPP-ATPG: A Circular Pipeline Processing Based Deterministic Parallel Test Pattern Generator., , and . J. Electron. Test., 32 (5): 625-638 (2016)