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Smart selection of indirect parameters for DC-based alternate RF IC testing.

, , , , , , , and . VTS, page 19-24. IEEE Computer Society, (2012)

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Sensors for built-in alternate RF test., , , and . European Test Symposium, page 49-54. IEEE Computer Society, (2010)Built-in Self Test for Error Vector Magnitude measurement of RF transceiver., , , and . ITC, page 1. IEEE Computer Society, (2009)Combining Internal Probing with Artificial Neural Networks for Optimal RFIC Testing., , , , and . ITC, page 1-9. IEEE Computer Society, (2006)Design of an embedded RF signal generator for BIST application., , , , and . NEWCAS, page 1-4. IEEE, (2013)Smart selection of indirect parameters for DC-based alternate RF IC testing., , , , , , , and . VTS, page 19-24. IEEE Computer Society, (2012)Production test of an RF receiver chain based on ATM combining RF BIST and machine learning algorithm., and . ECCTD, page 653-656. IEEE, (2011)RF Front-End Test Using Built-in Sensors., , , and . IEEE Des. Test Comput., 28 (6): 76-84 (2011)Experiences with non-intrusive sensors for RF built-in test., , , and . ITC, page 1-8. IEEE Computer Society, (2012)RF BIST and test strategy for the receive part of an RF transceiver in CMOS technology., , , and . ETS, page 1. IEEE Computer Society, (2013)