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Yield Learning Through Physically Aware Diagnosis of IC-Failure Populations., , , , and . IEEE Des. Test Comput., 29 (1): 36-47 (2012)Design-for-Manufacturability Assessment for Integrated Circuits Using RADAR., and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 33 (10): 1559-1572 (2014)An integrated functional performance simulator., , , , , and . IEEE Micro, 19 (3): 26-35 (1999)LearnX: A Hybrid Deterministic-Statistical Defect Diagnosis Methodology., and . ETS, page 1-6. IEEE, (2019)Improving Diagnosis Efficiency via Machine Learning., , , and . ITC, page 1-10. IEEE, (2018)Random Forest Architectures on FPGA for Multiple Applications., , and . ACM Great Lakes Symposium on VLSI, page 415-418. ACM, (2017)Towards Smarter Diagnosis: A Learning-based Diagnostic Outcome Previewer., , , and . ACM Trans. Design Autom. Electr. Syst., 25 (5): 43:1-43:20 (2020)Statistical defect-detection analysis of test sets using readily-available tester data., and . ICCAD, page 768-773. IEEE Computer Society, (2011)Virtual probe: A statistically optimal framework for minimum-cost silicon characterization of nanoscale integrated circuits., , and . ICCAD, page 433-440. ACM, (2009)Global Floorplanning via Semidefinite Programming., , , and . DAC, page 1-6. IEEE, (2023)