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Analyzing the electromigration effects on different metal layers and different wire lengths.

, , , and . ICECS, page 682-685. IEEE, (2014)

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Transistor sizing and gate sizing using geometric programming considering delay minimization., , , and . NEWCAS, page 85-88. IEEE, (2012)Effective Method for Simultaneous Gate Sizing and $V$ th Assignment Using Lagrangian Relaxation., , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 33 (4): 546-557 (2014)Reducing the number of transistors with gate clustering., , and . LASCAS, page 163-166. IEEE, (2016)ISPD 2019 Initial Detailed Routing Contest and Benchmark with Advanced Routing Rules., , , , , and . ISPD, page 147-151. ACM, (2019)Cell-Internal Electromigration: Analysis and Pin Placement Based Optimization., , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 35 (2): 220-231 (2016)Electromigration aware circuits by using special signal non-default routing rules., , and . ISCAS, page 2795-2798. IEEE, (2016)Impact on performance, power, area and wirelength using electromigration-aware cells., , , , and . ICECS, page 129-132. IEEE, (2015)Challenges and Approaches in VLSI Routing., , , , and . ISPD, page 185-192. ACM, (2022)Gate Sizing Minimizing Delay and Area., , , and . ISVLSI, page 315-316. IEEE Computer Society, (2011)A systematic approach for analyzing and optimizing cell-internal signal electromigration., , , , and . ICCAD, page 486-491. IEEE, (2014)