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320 × 240 Back-Illuminated 10-µm CAPD Pixels for High-Speed Modulation Time-of-Flight CMOS Image Sensor.

Y. Kato, T. Sano, Y. Moriyama, S. Maeda, T. Yamazaki, A. Nose, K. Shiina, Y. Yasu, W. van der Tempel, A. Ercan, Y. Ebiko, D. Nieuwenhove, and S. Sukegawa. IEEE J. Solid State Circuits, 53 (4): 1071-1078 (2018)

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Ryozo Maeda

Daniel Maeda

Aoi Maeda

Shinji Maeda

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Precise visual inspection for LSI wafer patterns using subpixel image alignment.T. Hiroi, S. Maeda, H. Kubota, K. Watanabe, and Y. Nakagawa. WACV, page 26-34. IEEE, (1994)Analyzing Causal Relationships of Sensor Data and Infrared Images to Stabilize Garbage Power Generation.K. Matsubayashi, T. Anjiki, and S. Maeda. ICMLC, page 1-6. IEEE, (2019)Precise detection of short-circuit defects on TFT substrate by infrared image matching.S. Maeda, M. Ono, H. Kubota, and M. Nakatani. Syst. Comput. Jpn., 30 (12): 72-84 (1999)Automated visual inspection for lsi water multilayer patterns by cascade pattern matching algorithm.S. Maeda, H. Kubota, H. Makihira, T. Ninomiya, Y. Nakagawa, and Y. Taniguchi. Syst. Comput. Jpn., 21 (12): 65-77 (1990)A Basic Study on Railway Facility Extraction Using a Single-Shot Multi-Box Detector.M. Nakamura, Y. Aoto, and S. Maeda. ICMLC, page 1-7. IEEE, (2019)Unified evaluation method of white uniformity for electronic displays.T. Asano, T. Kondoh, and S. Maeda. IECON, page 8341-8345. IEEE, (2013)Threshold setting assisted by numerical analysis methods in automatic visual inspection using gray-scale image comparison.S. Maeda, F. Endo, H. Makihira, and H. Kubota. Syst. Comput. Jpn., 29 (14): 81-91 (1998)Optimum threshold generation for automated visual inspection of large-scale integration wafer patterns.S. Maeda, H. Kubota, and H. Makihira. Syst. Comput. Jpn., 27 (11): 74-86 (1996)Utilization of the Infrared Image Capturing Combustion State for Estimating the Steam Flow Aming to Stabilize Garbage Power Generation.T. Anjiki, K. Matsubayashi, and S. Maeda. ICMLC, page 1-5. IEEE, (2019)320 × 240 Back-Illuminated 10-µm CAPD Pixels for High-Speed Modulation Time-of-Flight CMOS Image Sensor.Y. Kato, T. Sano, Y. Moriyama, S. Maeda, T. Yamazaki, A. Nose, K. Shiina, Y. Yasu, W. van der Tempel, A. Ercan and 3 other author(s). IEEE J. Solid State Circuits, 53 (4): 1071-1078 (2018)

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Disambiguation of "Maeda, Shunji"

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320 × 240 Back-Illuminated 10-µm CAPD Pixels for High-Speed Modulation Time-of-Flight CMOS Image Sensor.

Please choose a person to relate this publication to

Ryozo Maeda

Daniel Maeda

Aoi Maeda

Shinji Maeda

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Maeda, Shunji"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML 320 × 240 Back-Illuminated 10-µm CAPD Pixels for High-Speed Modulation Time-of-Flight CMOS Image Sensor.

Please choose a person to relate this publication to

Ryozo Maeda

Daniel Maeda

Aoi Maeda

Shinji Maeda

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
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APA
Chicago
DIN 1505
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320 × 240 Back-Illuminated 10-µm CAPD Pixels for High-Speed Modulation Time-of-Flight CMOS Image Sensor.