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Operation-aware assist circuit design for improved write performance of FinFET based SRAM.

, , , and . VDAT, page 1-6. IEEE, (2014)

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LISOCHIN: An NBTI Degradation Monitoring Sensor for Reliable CMOS Circuits., , and . VDAT, volume 711 of Communications in Computer and Information Science, page 441-451. Springer, (2017)A novel stability and process sensitivity driven model for optimal sized FinFET based SRAM., , , and . Microelectron. Reliab., 55 (8): 1131-1143 (2015)Operation-aware assist circuit design for improved write performance of FinFET based SRAM., , , and . VDAT, page 1-6. IEEE, (2014)A Novel FPGA Accelerator Design for Real-Time and Ultra-Low Power Deep Convolutional Neural Networks Compared With Titan X GPU., , , , and . IEEE Access, (2020)A New Sensitivity-Driven Process Variation Aware Self-Repairing Low-Power SRAM Design., , and . VLSID, page 116-121. IEEE Computer Society, (2014)Analysis of Single-Trap-Induced Random Telegraph Noise on Asymmetric High-k Spacer FinFET., , and . iNIS, page 264-267. IEEE, (2016)SUBHDIP: process variations tolerant subthreshold Darlington pair-based NBTI sensor circuit., , , and . IET Comput. Digit. Tech., 13 (3): 243-249 (2019)A comprehensive survey of fake news in social networks: Attributes, features, and detection approaches., , , and . J. King Saud Univ. Comput. Inf. Sci., 35 (6): 101571 (June 2023)Investigation of DC Characteristic on DG-Tunnel FET with High-K Dielectric Using Distinct Device Parameter., , , , and . iNIS, page 124-128. IEEE, (2016)An efficient NBTI sensor and compensation circuit for stable and reliable SRAM cells., , , and . Microelectron. Reliab., (2018)