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Measurement of $e^+ e^- K^+ K^-$ cross section at $s = 2.00 - 3.08$ GeV

B. Collaboration, M. Ablikim, M. Achasov, S. Ahmed, M. Albrecht, M. Alekseev, A. Amoroso, F. An, Q. An, J. Bai, Y. Bai, O. Bakina, R. Ferroli, Y. Ban, K. Begzsuren, D. Bennett, J. Bennett, N. Berger, M. Bertani, D. Bettoni, F. Bianchi, E. Boger, I. Boyko, R. Briere, H. Cai, X. Cai, O. Cakir, A. Calcaterra, G. Cao, S. Cetin, J. Chai, J. Chang, G. Chelkov, G. Chen, H. Chen, J. Chen, M. Chen, P. Chen, S. Chen, X. Chen, Y. Chen, W. Cheng, X. Chu, G. Cibinetto, F. Cossio, H. Dai, J. Dai, A. Dbeyssi, D. Dedovich, Z. Deng, A. Denig, I. Denysenko, M. Destefanis, F. De Mori, Y. Ding, C. Dong, J. Dong, L. Dong, M. Dong, Z. Dou, S. Du, P. Duan, J. Fang, S. Fang, Y. Fang, R. Farinelli, L. Fava, S. Fegan, F. Feldbauer, G. Felici, C. Feng, E. Fioravanti, M. Fritsch, C. Fu, Q. Gao, X. Gao, Y. Gao, Y. Gao, Z. Gao, B. Garillon, I. Garzia, A. Gilman, K. Goetzen, L. Gong, W. Gong, W. Gradl, M. Greco, M. Gu, Y. Gu, A. Guo, R. Guo, Y. Guo, A. Guskov, Z. Haddadi, S. Han, X. Hao, F. Harris, K. He, X. He, F. Heinsius, T. Held, Y. Heng, Z. Hou, H. Hu, J. Hu, T. Hu, Y. Hu, G. Huang, J. Huang, X. Huang, X. Huang, Z. Huang, T. Hussain, W. Andersson, M. Irshad, Q. Ji, Q. Ji, X. Ji, X. Ji, X. Jiang, X. Jiang, J. Jiao, Z. Jiao, D. Jin, S. Jin, Y. Jin, T. Johansson, A. Julin, N. Kalantar-Nayestanaki, X. Kang, M. Kavatsyuk, B. Ke, I. Keshk, T. Khan, A. Khoukaz, P. Kiese, R. Kiuchi, R. Kliemt, L. Koch, O. Kolcu, B. Kopf, M. Kornicer, M. Kuemmel, M. Kuessner, A. Kupsc, M. Kurth, W. Kühn, J. Lange, P. Larin, L. Lavezzi, H. Leithoff, C. Li, C. Li, D. Li, F. Li, F. Li, G. Li, H. Li, H. Li, J. Li, J. Li, J. Li, K. Li, K. Li, K. Li, L. Li, P. Li, P. Li, Q. Li, W. Li, W. Li, X. Li, X. Li, X. Li, Z. Li, H. Liang, Y. Liang, Y. Liang, G. Liao, L. Liao, J. Libby, C. Lin, D. Lin, B. Liu, B. Liu, C. Liu, D. Liu, D. Liu, F. Liu, F. Liu, F. Liu, H. Liu, H. Liu, H. Liu, H. Liu, H. Liu, J. Liu, J. Liu, K. Liu, K. Liu, K. Liu, L. Liu, Q. Liu, S. Liu, X. Liu, Y. Liu, Z. Liu, Z. Liu, Y. Long, X. Lou, H. Lu, J. Lu, Y. Lu, Y. Lu, C. Luo, M. Luo, T. Luo, X. Luo, S. Lusso, X. Lyu, F. Ma, H. Ma, L. Ma, M. Ma, Q. Ma, T. Ma, X. Ma, X. Ma, Y. Ma, F. Maas, M. Maggiora, S. Maldaner, Q. Malik, A. Mangoni, Y. Mao, Z. Mao, S. Marcello, Z. Meng, J. Messchendorp, G. Mezzadri, J. Min, R. Mitchell, X. Mo, Y. Mo, C. Morales, N. Muchnoi, H. Muramatsu, A. Mustafa, Y. Nefedov, F. Nerling, I. Nikolaev, Z. Ning, S. Nisar, S. Niu, X. Niu, S. Olsen, Q. Ouyang, S. Pacetti, Y. Pan, M. Papenbrock, P. Patteri, M. Pelizaeus, J. Pellegrino, H. Peng, Z. Peng, K. Peters, J. Pettersson, J. Ping, R. Ping, A. Pitka, R. Poling, V. Prasad, H. Qi, M. Qi, T. Qi, S. Qian, C. Qiao, N. Qin, X. Qin, Z. Qin, J. Qiu, S. Qu, K. Rashid, C. Redmer, M. Richter, M. Ripka, A. Rivetti, M. Rolo, G. Rong, C. Rosner, A. Sarantsev, M. Savrié, K. Schoenning, W. Shan, X. Shan, M. Shao, C. Shen, P. Shen, X. Shen, H. Sheng, X. Shi, J. Song, W. Song, X. Song, S. Sosio, C. Sowa, S. Spataro, G. Sun, J. Sun, L. Sun, S. Sun, X. Sun, Y. Sun, Y. Sun, Y. Sun, Z. Sun, Y. Tan, C. Tang, G. Tang, X. Tang, I. Tapan, M. Tiemens, B. Tsednee, I. Uman, B. Wang, B. Wang, D. Wang, D. Wang, D. Wang, K. Wang, L. Wang, L. Wang, M. Wang, M. Wang, P. Wang, P. Wang, W. Wang, X. Wang, X. Wang, Y. Wang, Y. Wang, Z. Wang, Z. Wang, Z. Wang, Z. Wang, T. Weber, D. Wei, P. Weidenkaff, S. Wen, U. Wiedner, M. Wolke, L. Wu, L. Wu, Z. Wu, L. Xia, Y. Xia, D. Xiao, Y. Xiao, Z. Xiao, Y. Xie, Y. Xie, X. Xiong, Q. Xiu, G. Xu, J. Xu, L. Xu, Q. Xu, Q. Xu, X. Xu, F. Yan, L. Yan, W. Yan, W. Yan, Y. Yan, H. Yang, H. Yang, L. Yang, R. Yang, Y. Yang, Y. Yang, Y. Yang, Z. Yang, M. Ye, M. Ye, J. Yin, Z. You, B. Yu, C. Yu, J. Yu, J. Yu, C. Yuan, Y. Yuan, A. Yuncu, A. Zafar, Y. Zeng, B. Zhang, B. Zhang, C. Zhang, D. Zhang, H. Zhang, H. Zhang, J. Zhang, J. Zhang, J. Zhang, J. Zhang, J. Zhang, J. Zhang, K. Zhang, L. Zhang, T. Zhang, X. Zhang, Y. Zhang, Y. Zhang, Y. Zhang, Y. Zhang, Y. Zhang, Y. Zhang, Y. Zhang, Z. Zhang, Z. Zhang, Z. Zhang, G. Zhao, J. Zhao, J. Zhao, J. Zhao, L. Zhao, L. Zhao, M. Zhao, Q. Zhao, S. Zhao, T. Zhao, Y. Zhao, Z. Zhao, A. Zhemchugov, B. Zheng, J. Zheng, Y. Zheng, B. Zhong, L. Zhou, Q. Zhou, X. Zhou, X. Zhou, X. Zhou, X. Zhou, X. Zhou, X. Zhou, A. Zhu, J. Zhu, J. Zhu, K. Zhu, K. Zhu, S. Zhu, S. Zhu, X. Zhu, Y. Zhu, Y. Zhu, Z. Zhu, J. Zhuang, B. Zou, and J. Zou. (2018)cite arxiv:1811.08742Comment: 8 figures.
DOI: 10.1103/PhysRevD.99.032001

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Liu Liu

mad al- H at t b

H -H Kaatz

Other publications of authors with the same name

A new uncertainty propagation method for problems with parameterized probability-boxes.H. Liu, C. Jiang, X. Jia, X. Long, Z. Zhang, and F. Guan. Reliab. Eng. Syst. Saf., (2018)Cu-based alloys for 3DP by melt extrusion process.C. Chou, W. Wei, B. Liu, A. Wang, and R. Luo. ICIT, page 1152-1157. IEEE, (2016)Measurement of $e^+ e^- K^+ K^-$ cross section at $s = 2.00 - 3.08$ GeVB. Collaboration, M. Ablikim, M. Achasov, S. Ahmed, M. Albrecht, M. Alekseev, A. Amoroso, F. An, Q. An, J. Bai and 450 other author(s). (2018)cite arxiv:1811.08742Comment: 8 figures.Improving Machining Accuracy of Thin-Wall Parts Using the Information-Localizing Technology.H. Liu, B. Hou, J. Zhang, and Y. Wang. ICIRA (2), volume 9245 of Lecture Notes in Computer Science, page 701-709. Springer, (2015)Improved contact lens injection molding production by 3D printed conformal cooling channels.Y. Lin, J. Wu, B. Liu, W. Wei, A. Wang, and R. Luo. SII, page 89-94. IEEE, (2017)Measurements of the absolute branching fractions for \$D\_s^+\rightarrowe^+\nu\_e\$ and \$D\_s^+\rightarrow\eta^\prime e^+\nu\_e\$M. Ablikim, M. Achasov, X. Ai, O. Albayrak, M. Albrecht, D. Ambrose, A. Amoroso, F. An, Q. An, J. Bai and 415 other author(s). (Aug 23, 2016)Ceramic feedstocks for additive manufacturing.N. Fan, W. Wei, B. Liu, A. Wang, and R. Luo. ICIT, page 1147-1151. IEEE, (2016)Measurement of the \$D\_s^+ \ell^+\nu\_\ell\$ branching fractions and the decay constant \$f\_D\_s^+\$M. Ablikim, M. Achasov, X. Ai, O. Albayrak, M. Albrecht, D. Ambrose, A. Amoroso, F. An, Q. An, J. Bai and 408 other author(s). (Aug 24, 2016)Design and test of additive manufacturing for coating thermoplastic PEEK material.C. Liu, Y. Hsieh, T. Sun, J. Zeng, A. Wang, N. Lee, S. Chau, W. Wei, B. Liu, and R. Luo. ICIT, page 1158-1162. IEEE, (2016)Glass and hot extrusion by ME module for 3D additive manufacturing.P. Wang, C. Chou, W. Wei, B. Liu, A. Liu, A. Wang, and R. Luo. ICIT, page 1167-1171. IEEE, (2016)

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Measurement of $e^+ e^- K^+ K^-$ cross section at $s = 2.00 - 3.08$ GeV

Please choose a person to relate this publication to

Liu Liu

Liu Liu

Liu Liu

mad al- H at t b

H -H Kaatz

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Liu, H. B."

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Measurement of $e^+ e^- K^+ K^-$ cross section at $s = 2.00 - 3.08$ GeV

Please choose a person to relate this publication to

Liu Liu

Liu Liu

Liu Liu

mad al- H at t b

H -H Kaatz

Other publications of authors with the same name

Disambiguation

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Measurement of $e^+ e^- K^+ K^-$ cross section at $s = 2.00 - 3.08$ GeV