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Disambiguation of "Lehninger, David"

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Impact of Temperature on Reliability of MFIS HZO-based Ferroelectric Tunnel Junctions.

, , , , , , , , , , , , , , and . IRPS, page 11-1. IEEE, (2022)

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Frank Lehninger

Wahyudi David

Florian Bodo David

Joachim David

Jens-Ulrich Davids

 

Other publications of authors with the same name

Ferroelectric HfO2/ZrO2 Superlattices with Improved Leakage at Bias and Temperature Stress., , , , , and . IMW, page 1-4. IEEE, (2023)BEoL integrated hafnium zirconium oxide varactors for tunable mmWave applications., , , , , and . ESSDERC, page 253-256. IEEE, (2022)Impact of Temperature on Reliability of MFIS HZO-based Ferroelectric Tunnel Junctions., , , , , , , , , and 5 other author(s). IRPS, page 11-1. IEEE, (2022)Permittivity Characterization of Ferroelectric Thin-Film Hafnium Zirconium Oxide Varactors up to 170 GHz., , , , , and . DRC, page 1-2. IEEE, (2023)Memory Array Demonstration of fully integrated 1T-1C FeFET concept with separated ferroelectric MFM device in interconnect layer., , , , , , , , , and 6 other author(s). VLSI Technology and Circuits, page 355-356. IEEE, (2022)Hafnium oxide-based Ferroelectric Memories: Are we ready for Application?, , , , , , , , , and . IMW, page 1-4. IEEE, (2023)Integration of BEoL Compatible 1T1C FeFET Memory Into an Established CMOS Technology., , , , , , , , , and 6 other author(s). IMW, page 1-4. IEEE, (2022)Impact of Ferroelectric Wakeup on Reliability of Laminate based Si-doped Hafnium Oxide (HSO) FeFET Memory Cells., , , , , , , , , and 9 other author(s). IRPS, page 1-9. IEEE, (2020)Study of Nanosecond Laser Annealing on Silicon Doped Hafnium Oxide Film Crystallization and Capacitor Reliability., , , , , , , , , and 7 other author(s). IMW, page 1-4. IEEE, (2022)