%0 Conference Paper %1 conf/dft/ChapmanD96 %A Chapman, Glenn H. %A Dufort, Benoit %B DFT %D 1996 %I IEEE Computer Society %K dblp %P 11-20 %T Making defect avoidance nearly invisible to the user in wafer scale field programmable gate arrays. %U http://dblp.uni-trier.de/db/conf/dft/dft1996.html#ChapmanD96 %@ 0-8186-7545-4

@inproceedings{conf/dft/ChapmanD96, added-at = {2023-03-24T00:00:00.000+0100}, author = {Chapman, Glenn H. and Dufort, Benoit}, biburl = {https://www.bibsonomy.org/bibtex/2b42cdb098c75a17cdf49026b3b77f042/dblp}, booktitle = {DFT}, crossref = {conf/dft/1996}, ee = {https://doi.ieeecomputersociety.org/10.1109/DFTVS.1996.571980}, interhash = {06b83cb78fafad7b4ebb71078bf7ce23}, intrahash = {b42cdb098c75a17cdf49026b3b77f042}, isbn = {0-8186-7545-4}, keywords = {dblp}, pages = {11-20}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T20:00:49.000+0200}, title = {Making defect avoidance nearly invisible to the user in wafer scale field programmable gate arrays.}, url = {http://dblp.uni-trier.de/db/conf/dft/dft1996.html#ChapmanD96}, year = 1996 }