%0 Conference Paper %1 conf/irps/CioniFRSCMVCC22 %A Cioni, Marcello %A Fiorenza, Patrick %A Roccaforte, Fabrizio %A Saggio, Mario %A Cascino, S. %A Messina, Angelo Alberto %A Vinciguerra, Vincenzo %A Calabretta, Michele %A Chini, Alessandro %B IRPS %D 2022 %I IEEE %K dblp %P 5 %T Identification of Interface States responsible for VTH Hysteresis in packaged SiC MOSFETs. %U http://dblp.uni-trier.de/db/conf/irps/irps2022.html#CioniFRSCMVCC22 %@ 978-1-6654-7950-9

@inproceedings{conf/irps/CioniFRSCMVCC22, added-at = {2023-10-28T00:00:00.000+0200}, author = {Cioni, Marcello and Fiorenza, Patrick and Roccaforte, Fabrizio and Saggio, Mario and Cascino, S. and Messina, Angelo Alberto and Vinciguerra, Vincenzo and Calabretta, Michele and Chini, Alessandro}, biburl = {https://www.bibsonomy.org/bibtex/23e3b93b0e80502af3bf3bd9bde7426f3/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2022}, ee = {https://doi.org/10.1109/IRPS48227.2022.9764543}, interhash = {0f0e93fb8836cc8d2c1ee4cf9574aa23}, intrahash = {3e3b93b0e80502af3bf3bd9bde7426f3}, isbn = {978-1-6654-7950-9}, keywords = {dblp}, pages = 5, publisher = {IEEE}, timestamp = {2024-04-09T12:18:58.000+0200}, title = {Identification of Interface States responsible for VTH Hysteresis in packaged SiC MOSFETs.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2022.html#CioniFRSCMVCC22}, year = 2022 }