%0 Conference Paper %1 conf/smacd/Diaz-FortunyMRN17a %A Diaz-Fortuny, Javier %A Martín-Martínez, Javier %A Rodríguez, Rosana %A Nafría, Montserrat %A Castro-López, Rafael %A Roca, Elisenda %A Fernández, Francisco V. %A Barajas, Enrique %A Aragonès, Xavier %A Mateo, Diego %B SMACD %D 2017 %I IEEE %K dblp %P 1-4 %T A transistor array chip for the statistical characterization of process variability, RTN and BTI/CHC aging. %U http://dblp.uni-trier.de/db/conf/smacd/smacd2017.html#Diaz-FortunyMRN17a %@ 978-1-5090-5052-9

@inproceedings{conf/smacd/Diaz-FortunyMRN17a, added-at = {2023-09-30T00:00:00.000+0200}, author = {Diaz-Fortuny, Javier and Martín-Martínez, Javier and Rodríguez, Rosana and Nafría, Montserrat and Castro-López, Rafael and Roca, Elisenda and Fernández, Francisco V. and Barajas, Enrique and Aragonès, Xavier and Mateo, Diego}, biburl = {https://www.bibsonomy.org/bibtex/2087de3493353e91314fcffb062a333e4/dblp}, booktitle = {SMACD}, crossref = {conf/smacd/2017}, ee = {https://doi.org/10.1109/SMACD.2017.7981600}, interhash = {103d1e26e7316a23f46c476cf1a053f7}, intrahash = {087de3493353e91314fcffb062a333e4}, isbn = {978-1-5090-5052-9}, keywords = {dblp}, pages = {1-4}, publisher = {IEEE}, timestamp = {2024-04-10T08:26:48.000+0200}, title = {A transistor array chip for the statistical characterization of process variability, RTN and BTI/CHC aging.}, url = {http://dblp.uni-trier.de/db/conf/smacd/smacd2017.html#Diaz-FortunyMRN17a}, year = 2017 }