%0 Conference Paper %1 conf/ats/ChengH0CZGG13 %A Cheng, Da %A Hsiung, Hsunwei %A Liu, Bin %A Chen, Jianing %A Zeng, Jia %A Govindan, Ramesh %A Gupta, Sandeep K. %B Asian Test Symposium %D 2013 %I IEEE Computer Society %K dblp %P 115-122 %T A New March Test for Process-Variation Induced Delay Faults in SRAMs. %U http://dblp.uni-trier.de/db/conf/ats/ats2013.html#ChengH0CZGG13 %@ 978-0-7695-5080-0

@inproceedings{conf/ats/ChengH0CZGG13, added-at = {2023-09-22T00:00:00.000+0200}, author = {Cheng, Da and Hsiung, Hsunwei and Liu, Bin and Chen, Jianing and Zeng, Jia and Govindan, Ramesh and Gupta, Sandeep K.}, biburl = {https://www.bibsonomy.org/bibtex/2d08a796f43050ebbe72728d287cf682d/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/2013}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2013.31}, interhash = {065ff8c0d98e0b984fd65abb758d4fb7}, intrahash = {d08a796f43050ebbe72728d287cf682d}, isbn = {978-0-7695-5080-0}, keywords = {dblp}, pages = {115-122}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:36:09.000+0200}, title = {A New March Test for Process-Variation Induced Delay Faults in SRAMs.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2013.html#ChengH0CZGG13}, year = 2013 }