%0 Journal Article %1 journals/mr/VecchioCDBLLB15 %A Vecchio, Pamela Del %A Curutchet, Arnaud %A Deshayes, Yannick %A Bettiati, M. %A Laruelle, F. %A Labat, Nathalie %A Béchou, Laurent %D 2015 %J Microelectron. Reliab. %K dblp %N 9-10 %P 1741-1745 %T Correlation between forward-reverse low-frequency noise and atypical I-V signatures in 980 nm high-power laser diodes. %U http://dblp.uni-trier.de/db/journals/mr/mr55.html#VecchioCDBLLB15 %V 55

@article{journals/mr/VecchioCDBLLB15, added-at = {2020-04-16T00:00:00.000+0200}, author = {Vecchio, Pamela Del and Curutchet, Arnaud and Deshayes, Yannick and Bettiati, M. and Laruelle, F. and Labat, Nathalie and Béchou, Laurent}, biburl = {https://www.bibsonomy.org/bibtex/2c1d97e3cd87fefa01b1651438670ea77/dblp}, ee = {https://doi.org/10.1016/j.microrel.2015.06.041}, interhash = {0d75b855020b3ce02f41ffc12223483d}, intrahash = {c1d97e3cd87fefa01b1651438670ea77}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-10}, pages = {1741-1745}, timestamp = {2020-04-17T12:00:46.000+0200}, title = {Correlation between forward-reverse low-frequency noise and atypical I-V signatures in 980 nm high-power laser diodes.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr55.html#VecchioCDBLLB15}, volume = 55, year = 2015 }