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%0 Conference Paper
%1 conf/ats/HsiaoB09
%A Hsiao, Michael S.
%A Banga, Mainak
%B Asian Test Symposium
%D 2009
%I IEEE Computer Society
%K dblp
%P 225-230
%T Kiss the Scan Goodbye: A Non-scan Architecture for High Coverage, Low Test Data Volume and Low Test Application Time.
%U http://dblp.uni-trier.de/db/conf/ats/ats2009.html#HsiaoB09
%@ 978-0-7695-3864-8
@inproceedings{conf/ats/HsiaoB09,
added-at = {2023-03-24T00:00:00.000+0100},
author = {Hsiao, Michael S. and Banga, Mainak},
biburl = {https://www.bibsonomy.org/bibtex/276b038675b053fe3691c9ccead950b9c/dblp},
booktitle = {Asian Test Symposium},
crossref = {conf/ats/2009},
ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2009.17},
interhash = {139ebd90bd9ce1996ec66e3f9949e7b9},
intrahash = {76b038675b053fe3691c9ccead950b9c},
isbn = {978-0-7695-3864-8},
keywords = {dblp},
pages = {225-230},
publisher = {IEEE Computer Society},
timestamp = {2024-04-10T06:37:09.000+0200},
title = {Kiss the Scan Goodbye: A Non-scan Architecture for High Coverage, Low Test Data Volume and Low Test Application Time.},
url = {http://dblp.uni-trier.de/db/conf/ats/ats2009.html#HsiaoB09},
year = 2009
}