%0 Conference Paper %1 conf/ats/HsiaoB09 %A Hsiao, Michael S. %A Banga, Mainak %B Asian Test Symposium %D 2009 %I IEEE Computer Society %K dblp %P 225-230 %T Kiss the Scan Goodbye: A Non-scan Architecture for High Coverage, Low Test Data Volume and Low Test Application Time. %U http://dblp.uni-trier.de/db/conf/ats/ats2009.html#HsiaoB09 %@ 978-0-7695-3864-8

@inproceedings{conf/ats/HsiaoB09, added-at = {2023-03-24T00:00:00.000+0100}, author = {Hsiao, Michael S. and Banga, Mainak}, biburl = {https://www.bibsonomy.org/bibtex/276b038675b053fe3691c9ccead950b9c/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/2009}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2009.17}, interhash = {139ebd90bd9ce1996ec66e3f9949e7b9}, intrahash = {76b038675b053fe3691c9ccead950b9c}, isbn = {978-0-7695-3864-8}, keywords = {dblp}, pages = {225-230}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:37:09.000+0200}, title = {Kiss the Scan Goodbye: A Non-scan Architecture for High Coverage, Low Test Data Volume and Low Test Application Time.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2009.html#HsiaoB09}, year = 2009 }