%0 Journal Article %1 journals/mr/HuLSZNCBZ11 %A Hu, Zhiyuan %A Liu, Zhangli %A Shao, Hua %A Zhang, Zhengxuan %A Ning, Bingxu %A Chen, Ming %A Bi, Dawei %A Zou, Shichang %D 2011 %J Microelectron. Reliab. %K dblp %N 8 %P 1295-1301 %T Total ionizing dose effects in elementary devices for 180-nm flash technologies. %U http://dblp.uni-trier.de/db/journals/mr/mr51.html#HuLSZNCBZ11 %V 51

@article{journals/mr/HuLSZNCBZ11, added-at = {2020-02-22T00:00:00.000+0100}, author = {Hu, Zhiyuan and Liu, Zhangli and Shao, Hua and Zhang, Zhengxuan and Ning, Bingxu and Chen, Ming and Bi, Dawei and Zou, Shichang}, biburl = {https://www.bibsonomy.org/bibtex/20306a752b30355114c29ff6f436c876e/dblp}, ee = {https://doi.org/10.1016/j.microrel.2011.03.026}, interhash = {13ffc690443b4028e6d0fcc5141f6222}, intrahash = {0306a752b30355114c29ff6f436c876e}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = 8, pages = {1295-1301}, timestamp = {2020-02-25T13:23:17.000+0100}, title = {Total ionizing dose effects in elementary devices for 180-nm flash technologies.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr51.html#HuLSZNCBZ11}, volume = 51, year = 2011 }