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Total ionizing dose effects in elementary devices for 180-nm flash technologies.

Z. Hu, Z. Liu, H. Shao, Z. Zhang, B. Ning, M. Chen, D. Bi, и S. Zou. Microelectron. Reliab., 51 (8): 1295-1301 (2011)

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Shichang Wang

Yang Zou

Zhurong Zou

Yang Zou

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Soft-Error-Tolerant Ultralow-Leakage 12T SRAM Bitcell Design.J. Jiang, D. Lin, J. Xiao, и S. Zou. ICICDT, стр. 1-2. IEEE, (2019)Quadruple Cross-Coupled Latch-Based 10T and 12T SRAM Bit-Cell Designs for Highly Reliable Terrestrial Applications.J. Jiang, Y. Xu, W. Zhu, J. Xiao, и S. Zou. IEEE Trans. Circuits Syst. I Regul. Pap., 66-I (3): 967-977 (2019)Total ionizing dose effects in elementary devices for 180-nm flash technologies.Z. Hu, Z. Liu, H. Shao, Z. Zhang, B. Ning, M. Chen, D. Bi, и S. Zou. Microelectron. Reliab., 51 (8): 1295-1301 (2011)Impact of within-wafer process variability on radiation response.Z. Hu, Z. Liu, H. Shao, Z. Zhang, B. Ning, M. Chen, D. Bi, и S. Zou. Microelectron. J., 42 (6): 883-888 (2011)Demonstration of improvement of specific on-resistance versus breakdown voltage tradeoff for low-voltage power LDMOS.Z. Xu, D. Liu, J. Hu, F. Jin, X. Yang, W. Duan, W. Yue, Z. Fang, W. Qian, W. Kong и 1 other автор(ы). Microelectron. J., (2019)A charge pump system with new regulation and clocking scheme.W. Zhu, J. Jiang, D. Lin, J. Xiao, G. Yang, X. Li, и S. Zou. IEICE Electron. Express, 16 (4): 20190005 (2019)A High-Performance and Low-Cost Single-Event Multiple-Node-Upsets Resilient Latch Design.Z. Liu, H. Zhang, J. Jiang, Y. Jia, Y. Xie, S. Zou, и Z. Zhang. IEEE Trans. Very Large Scale Integr. Syst., 30 (12): 1867-1877 (2022)A highly stable and low-cost 12T radiation hardened SRAM cell design for aerospace application.Z. Liu, Y. Xie, T. Xu, Q. Liu, D. Bi, Z. Hu, S. Zou, и Z. Zhang. Int. J. Circuit Theory Appl., 51 (8): 3938-3948 (августа 2023)Bias dependence of TID radiation responses of 0.13 μm partially depleted SOI NMOSFETs.B. Ning, D. Bi, H. Huang, Z. Zhang, Z. Hu, M. Chen, и S. Zou. Microelectron. Reliab., 53 (2): 259-264 (2013)A compact and CMOS compatible MMI coupler with very low excess loss.Z. Sheng, Z. Wang, C. Qiu, L. Li, A. Pang, A. Wu, X. Wang, S. Zou, и F. Gan. OFC/NFOEC, стр. 1-3. IEEE, (2013)

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Please choose a person to relate this publication to

Shichang Wang

Shichang Wang

Yang Zou

Zhurong Zou

Yang Zou

Другие публикации лиц с тем же именем

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