%0 Journal Article %1 yoon:3976 %A Yoon, C. S. %A Lee, J. H. %A Jeong, H. D. %A Kim, C. K. %A Yuh, J. H. %A Haasch, Rick %D 2002 %I AIP %J Applied Physics Letters %K diffusion %N 21 %P 3976-3978 %R 10.1063/1.1481185 %T Diffusion study of the exchange-biased NiFe/MnIr/CoFe electrode in magnetic tunnel junctions %U http://link.aip.org/link/?APL/80/3976/1 %V 80

@article{yoon:3976, added-at = {2008-07-01T12:20:04.000+0200}, author = {Yoon, C. S. and Lee, J. H. and Jeong, H. D. and Kim, C. K. and Yuh, J. H. and Haasch, Rick}, biburl = {https://www.bibsonomy.org/bibtex/2205250cf6dbab90405a9e0b6cbc183ee/srd27}, doi = {10.1063/1.1481185}, interhash = {1a9f643fd0e154f335b44b9db01c4076}, intrahash = {205250cf6dbab90405a9e0b6cbc183ee}, journal = {Applied Physics Letters}, keywords = {diffusion}, number = 21, pages = {3976-3978}, publisher = {AIP}, timestamp = {2008-07-01T12:20:04.000+0200}, title = {Diffusion study of the exchange-biased NiFe/MnIr/CoFe electrode in magnetic tunnel junctions}, url = {http://link.aip.org/link/?APL/80/3976/1}, volume = 80, year = 2002 }