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CoFe electrode in magnetic tunnel junctions

C. Yoon, J. Lee, H. Jeong, C. Kim, J. Yuh, и R. Haasch. Applied Physics Letters, 80 (21): 3976-3978 (2002)
DOI: 10.1063/1.1481185

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H J Plüss

H -J Bielig

J. H. Merkin

J H Mazaheri

H J Reeb

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