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%0 Journal Article
%1 journals/tcad/RudnickPGN97
%A Rudnick, Elizabeth M.
%A Patel, Janak H.
%A Greenstein, Gary S.
%A Niermann, Thomas M.
%D 1997
%J IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
%K dblp
%N 9
%P 1034-1044
%T A genetic algorithm framework for test generation.
%U http://dblp.uni-trier.de/db/journals/tcad/tcad16.html#RudnickPGN97
%V 16
@article{journals/tcad/RudnickPGN97,
added-at = {2020-09-24T00:00:00.000+0200},
author = {Rudnick, Elizabeth M. and Patel, Janak H. and Greenstein, Gary S. and Niermann, Thomas M.},
biburl = {https://www.bibsonomy.org/bibtex/2673a66d768641a9ff0e75417804f6a8f/dblp},
ee = {https://doi.org/10.1109/43.658571},
interhash = {1dbe6cc765b4f75f51b049932a4079db},
intrahash = {673a66d768641a9ff0e75417804f6a8f},
journal = {IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.},
keywords = {dblp},
number = 9,
pages = {1034-1044},
timestamp = {2020-09-25T11:47:50.000+0200},
title = {A genetic algorithm framework for test generation.},
url = {http://dblp.uni-trier.de/db/journals/tcad/tcad16.html#RudnickPGN97},
volume = 16,
year = 1997
}