%0 Journal Article %1 journals/tcad/RudnickPGN97 %A Rudnick, Elizabeth M. %A Patel, Janak H. %A Greenstein, Gary S. %A Niermann, Thomas M. %D 1997 %J IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. %K dblp %N 9 %P 1034-1044 %T A genetic algorithm framework for test generation. %U http://dblp.uni-trier.de/db/journals/tcad/tcad16.html#RudnickPGN97 %V 16

@article{journals/tcad/RudnickPGN97, added-at = {2020-09-24T00:00:00.000+0200}, author = {Rudnick, Elizabeth M. and Patel, Janak H. and Greenstein, Gary S. and Niermann, Thomas M.}, biburl = {https://www.bibsonomy.org/bibtex/2673a66d768641a9ff0e75417804f6a8f/dblp}, ee = {https://doi.org/10.1109/43.658571}, interhash = {1dbe6cc765b4f75f51b049932a4079db}, intrahash = {673a66d768641a9ff0e75417804f6a8f}, journal = {IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.}, keywords = {dblp}, number = 9, pages = {1034-1044}, timestamp = {2020-09-25T11:47:50.000+0200}, title = {A genetic algorithm framework for test generation.}, url = {http://dblp.uni-trier.de/db/journals/tcad/tcad16.html#RudnickPGN97}, volume = 16, year = 1997 }