Inproceedings,
New reliability mechanisms in memory design for sub-22nm technologies.
N. Aymerich, A. Asenov, A. Brown, R. Canal, B. Cheng, J. Figueras, A. González, E. Herrero, S. Markov, M. Miranda, P. Pouyan, T. Ramírez, A. Rubio, E. Vatajelu, X. Vera, X. Wang, and P. Zuber.IOLTS, page 111-114. IEEE Computer Society, (2011)
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- BibTeX key
- conf/iolts/AymerichABCCFGHMMPRRVVWZ11
- entry type
- inproceedings
- booktitle
- IOLTS
- year
- 2011
- pages
- 111-114
- publisher
- IEEE Computer Society
- crossref
- conf/iolts/2011
- ee
- https://doi.ieeecomputersociety.org/10.1109/IOLTS.2011.5993820
- isbn
- 978-1-4577-1053-7
- url
- http://dblp.uni-trier.de/db/conf/iolts/iolts2011.html#AymerichABCCFGHMMPRRVVWZ11
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%1 conf/iolts/AymerichABCCFGHMMPRRVVWZ11
%A Aymerich, Nivard
%A Asenov, A.
%A Brown, Andrew R.
%A Canal, Ramon
%A Cheng, Binjie
%A Figueras, Joan
%A González, Antonio
%A Herrero, Enric
%A Markov, S.
%A Miranda, Miguel
%A Pouyan, Peyman
%A Ramírez, Tanausú
%A Rubio, Antonio
%A Vatajelu, Elena I.
%A Vera, Xavier
%A Wang, Xingsheng
%A Zuber, Paul
%B IOLTS
%D 2011
%I IEEE Computer Society
%K dblp
%P 111-114
%T New reliability mechanisms in memory design for sub-22nm technologies.
%U http://dblp.uni-trier.de/db/conf/iolts/iolts2011.html#AymerichABCCFGHMMPRRVVWZ11
%@ 978-1-4577-1053-7
@inproceedings{conf/iolts/AymerichABCCFGHMMPRRVVWZ11,
added-at = {2023-07-11T00:00:00.000+0200},
author = {Aymerich, Nivard and Asenov, A. and Brown, Andrew R. and Canal, Ramon and Cheng, Binjie and Figueras, Joan and González, Antonio and Herrero, Enric and Markov, S. and Miranda, Miguel and Pouyan, Peyman and Ramírez, Tanausú and Rubio, Antonio and Vatajelu, Elena I. and Vera, Xavier and Wang, Xingsheng and Zuber, Paul},
biburl = {https://www.bibsonomy.org/bibtex/2f24c5824ccca4f103083884091d1543f/dblp},
booktitle = {IOLTS},
crossref = {conf/iolts/2011},
ee = {https://doi.ieeecomputersociety.org/10.1109/IOLTS.2011.5993820},
interhash = {23d105bc07f3f12a28e83f7b2be30a92},
intrahash = {f24c5824ccca4f103083884091d1543f},
isbn = {978-1-4577-1053-7},
keywords = {dblp},
pages = {111-114},
publisher = {IEEE Computer Society},
timestamp = {2024-04-10T10:52:08.000+0200},
title = {New reliability mechanisms in memory design for sub-22nm technologies.},
url = {http://dblp.uni-trier.de/db/conf/iolts/iolts2011.html#AymerichABCCFGHMMPRRVVWZ11},
year = 2011
}