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New reliability mechanisms in memory design for sub-22nm technologies.

, , , , , , , , , , , , , , , , и . IOLTS, стр. 111-114. IEEE Computer Society, (2011)

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R. A. A. Bowler

°Ake °Akerström

Mohamed A A Anndif

Eltohamy A A Yousef

A Brunk

 

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