%0 Journal Article %1 journals/mam/MahdaviRF22 %A Mahdavi, Nooshin %A Razaghian, Farhad %A Farbeh, Hamed %D 2022 %J Microprocess. Microsystems %K dblp %P 104462 %T An Architectural-Level Reliability Improvement Scheme in STT-MRAM Main Memory. %U http://dblp.uni-trier.de/db/journals/mam/mam90.html#MahdaviRF22 %V 90

@article{journals/mam/MahdaviRF22, added-at = {2023-09-08T00:00:00.000+0200}, author = {Mahdavi, Nooshin and Razaghian, Farhad and Farbeh, Hamed}, biburl = {https://www.bibsonomy.org/bibtex/2a45cefaa95e0576da7e097e5a66d1580/dblp}, ee = {https://doi.org/10.1016/j.micpro.2022.104462}, interhash = {2b26c7afcc22bec7dd8dfd5993eeeace}, intrahash = {a45cefaa95e0576da7e097e5a66d1580}, journal = {Microprocess. Microsystems}, keywords = {dblp}, month = {April}, pages = 104462, timestamp = {2024-04-08T19:07:58.000+0200}, title = {An Architectural-Level Reliability Improvement Scheme in STT-MRAM Main Memory.}, url = {http://dblp.uni-trier.de/db/journals/mam/mam90.html#MahdaviRF22}, volume = 90, year = 2022 }