%0 Conference Paper %1 conf/irps/TallaricoRDCSF20 %A Tallarico, Andrea Natale %A Reggiani, Susanna %A Depetro, Riccardo %A Croce, Giuseppe %A Sangiorgi, Enrico %A Fiegna, Claudio %B IRPS %D 2020 %I IEEE %K dblp %P 1-5 %T Full Understanding of Hot Electrons and Hot/Cold Holes in the Degradation of p-channel Power LDMOS Transistors. %U http://dblp.uni-trier.de/db/conf/irps/irps2020.html#TallaricoRDCSF20 %@ 978-1-7281-3199-3

@inproceedings{conf/irps/TallaricoRDCSF20, added-at = {2022-04-09T00:00:00.000+0200}, author = {Tallarico, Andrea Natale and Reggiani, Susanna and Depetro, Riccardo and Croce, Giuseppe and Sangiorgi, Enrico and Fiegna, Claudio}, biburl = {https://www.bibsonomy.org/bibtex/2d50f4570b3ad00d603485b5da0667fb2/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2020}, ee = {https://doi.org/10.1109/IRPS45951.2020.9129112}, interhash = {34d7a47415ae329fe21ac04d118e146b}, intrahash = {d50f4570b3ad00d603485b5da0667fb2}, isbn = {978-1-7281-3199-3}, keywords = {dblp}, pages = {1-5}, publisher = {IEEE}, timestamp = {2024-04-10T16:56:46.000+0200}, title = {Full Understanding of Hot Electrons and Hot/Cold Holes in the Degradation of p-channel Power LDMOS Transistors.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2020.html#TallaricoRDCSF20}, year = 2020 }