%0 Conference Paper %1 conf/iccad/WangW22 %A Wang, Qijing %A Wong, Martin D. F. %B ICCAD %D 2022 %E Mitra, Tulika %E Young, Evangeline F. Y. %E Xiong, Jinjun %I ACM %K dblp %P 125:1-125:8 %T WaferHSL: Wafer Failure Pattern Classification with Efficient Human-Like Staged Learning. %U http://dblp.uni-trier.de/db/conf/iccad/iccad2022.html#WangW22 %@ 978-1-4503-9217-4

@inproceedings{conf/iccad/WangW22, added-at = {2023-06-06T00:00:00.000+0200}, author = {Wang, Qijing and Wong, Martin D. F.}, biburl = {https://www.bibsonomy.org/bibtex/2aeadb75cef1caebf0a3eb96528661895/dblp}, booktitle = {ICCAD}, crossref = {conf/iccad/2022}, editor = {Mitra, Tulika and Young, Evangeline F. Y. and Xiong, Jinjun}, ee = {https://ieeexplore.ieee.org/document/10070023}, interhash = {36f701826e7dfa2b38fac3416b714691}, intrahash = {aeadb75cef1caebf0a3eb96528661895}, isbn = {978-1-4503-9217-4}, keywords = {dblp}, pages = {125:1-125:8}, publisher = {ACM}, timestamp = {2024-04-09T19:27:32.000+0200}, title = {WaferHSL: Wafer Failure Pattern Classification with Efficient Human-Like Staged Learning.}, url = {http://dblp.uni-trier.de/db/conf/iccad/iccad2022.html#WangW22}, year = 2022 }