%0 Journal Article %1 journals/pieee/LeachM10 %A Leach, Jacob H. %A Morkoç, Hadis %D 2010 %J Proc. IEEE %K dblp %N 7 %P 1127-1139 %T Status of Reliability of GaN-Based Heterojunction Field Effect Transistors. %U http://dblp.uni-trier.de/db/journals/pieee/pieee98.html#LeachM10 %V 98

@article{journals/pieee/LeachM10, added-at = {2022-10-02T00:00:00.000+0200}, author = {Leach, Jacob H. and Morkoç, Hadis}, biburl = {https://www.bibsonomy.org/bibtex/27fdb5891e5aad1bd5531f026e25a8c13/dblp}, ee = {https://doi.org/10.1109/JPROC.2010.2044858}, interhash = {38379848cb65bde5e4de791bf186629b}, intrahash = {7fdb5891e5aad1bd5531f026e25a8c13}, journal = {Proc. IEEE}, keywords = {dblp}, number = 7, pages = {1127-1139}, timestamp = {2024-04-09T04:37:20.000+0200}, title = {Status of Reliability of GaN-Based Heterojunction Field Effect Transistors.}, url = {http://dblp.uni-trier.de/db/journals/pieee/pieee98.html#LeachM10}, volume = 98, year = 2010 }