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%0 Journal Article
%1 journals/pieee/LeachM10
%A Leach, Jacob H.
%A Morkoç, Hadis
%D 2010
%J Proc. IEEE
%K dblp
%N 7
%P 1127-1139
%T Status of Reliability of GaN-Based Heterojunction Field Effect Transistors.
%U http://dblp.uni-trier.de/db/journals/pieee/pieee98.html#LeachM10
%V 98
@article{journals/pieee/LeachM10,
added-at = {2022-10-02T00:00:00.000+0200},
author = {Leach, Jacob H. and Morkoç, Hadis},
biburl = {https://www.bibsonomy.org/bibtex/27fdb5891e5aad1bd5531f026e25a8c13/dblp},
ee = {https://doi.org/10.1109/JPROC.2010.2044858},
interhash = {38379848cb65bde5e4de791bf186629b},
intrahash = {7fdb5891e5aad1bd5531f026e25a8c13},
journal = {Proc. IEEE},
keywords = {dblp},
number = 7,
pages = {1127-1139},
timestamp = {2024-04-09T04:37:20.000+0200},
title = {Status of Reliability of GaN-Based Heterojunction Field Effect Transistors.},
url = {http://dblp.uni-trier.de/db/journals/pieee/pieee98.html#LeachM10},
volume = 98,
year = 2010
}