%0 Conference Paper %1 conf/iccd/MarchokM96 %A Marchok, Thomas E. %A Maly, Wojciech %B ICCD %D 1996 %I IEEE Computer Society %K dblp %P 261-271 %T Modeling the Difficulty of Sequential Automatic Test Pattern Generation. %U http://dblp.uni-trier.de/db/conf/iccd/iccd1996.html#MarchokM96 %@ 0-8186-7554-3

@inproceedings{conf/iccd/MarchokM96, added-at = {2023-03-23T00:00:00.000+0100}, author = {Marchok, Thomas E. and Maly, Wojciech}, biburl = {https://www.bibsonomy.org/bibtex/24f2b6e106da8ff445ae0fdfb144b59af/dblp}, booktitle = {ICCD}, crossref = {conf/iccd/1996}, ee = {https://doi.ieeecomputersociety.org/10.1109/ICCD.1996.563566}, interhash = {3a084dd571232a9fe8bd2488237e1e58}, intrahash = {4f2b6e106da8ff445ae0fdfb144b59af}, isbn = {0-8186-7554-3}, keywords = {dblp}, pages = {261-271}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T21:59:17.000+0200}, title = {Modeling the Difficulty of Sequential Automatic Test Pattern Generation.}, url = {http://dblp.uni-trier.de/db/conf/iccd/iccd1996.html#MarchokM96}, year = 1996 }