%0 Journal Article %1 journals/mr/Moensb08 %A Moens, Peter %A den Bosch, Geert Van %D 2008 %J Microelectron. Reliab. %K dblp %N 8-9 %P 1300-1305 %T Reliability assessment of integrated power transistors: Lateral DMOS versus vertical DMOS. %U http://dblp.uni-trier.de/db/journals/mr/mr48.html#Moensb08 %V 48

@article{journals/mr/Moensb08, added-at = {2021-02-24T00:00:00.000+0100}, author = {Moens, Peter and den Bosch, Geert Van}, biburl = {https://www.bibsonomy.org/bibtex/2b4a39ebf9a02584aa3640c90d05f7370/dblp}, ee = {https://doi.org/10.1016/j.microrel.2008.06.048}, interhash = {3b26f7f1a666e1e067462f95e59d4e9e}, intrahash = {b4a39ebf9a02584aa3640c90d05f7370}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {8-9}, pages = {1300-1305}, timestamp = {2024-04-09T02:50:51.000+0200}, title = {Reliability assessment of integrated power transistors: Lateral DMOS versus vertical DMOS.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr48.html#Moensb08}, volume = 48, year = 2008 }