%0 Journal Article %1 journals/micro/NetoRVWK06 %A Neto, Egas Henes %A Ribeiro, Ivandro %A Vieira, Michele G. %A Wirth, Gilson I. %A Kastensmidt, Fernanda Lima %D 2006 %J IEEE Micro %K dblp %N 5 %P 10-18 %T Using Bulk Built-in Current Sensors to Detect Soft Errors. %U http://dblp.uni-trier.de/db/journals/micro/micro26.html#NetoRVWK06 %V 26

@article{journals/micro/NetoRVWK06, added-at = {2021-10-14T00:00:00.000+0200}, author = {Neto, Egas Henes and Ribeiro, Ivandro and Vieira, Michele G. and Wirth, Gilson I. and Kastensmidt, Fernanda Lima}, biburl = {https://www.bibsonomy.org/bibtex/29cdfdf4bdc6351ac3c1e554628d764f6/dblp}, ee = {http://doi.ieeecomputersociety.org/10.1109/MM.2006.103}, interhash = {3d36027b68dc4f5571c1057fe31cc4c0}, intrahash = {9cdfdf4bdc6351ac3c1e554628d764f6}, journal = {IEEE Micro}, keywords = {dblp}, number = 5, pages = {10-18}, timestamp = {2024-04-08T12:47:10.000+0200}, title = {Using Bulk Built-in Current Sensors to Detect Soft Errors.}, url = {http://dblp.uni-trier.de/db/journals/micro/micro26.html#NetoRVWK06}, volume = 26, year = 2006 }