Please log in to take part in the discussion (add own reviews or comments).
Cite this publication
More citation styles
- please select -
%0 Conference Paper
%1 conf/sips/WuKMB21
%A Wu, Tony F.
%A Kim, Doyun
%A Morris, Daniel H.
%A Beigné, Edith
%B SiPS
%D 2021
%I IEEE
%K dblp
%P 1-3
%T Evaluation of Low-Voltage SRAM for Error-Resilient Augmented Reality Applications.
%U http://dblp.uni-trier.de/db/conf/sips/sips2021.html#WuKMB21
%@ 978-1-6654-0144-9
@inproceedings{conf/sips/WuKMB21,
added-at = {2021-11-17T00:00:00.000+0100},
author = {Wu, Tony F. and Kim, Doyun and Morris, Daniel H. and Beigné, Edith},
biburl = {https://www.bibsonomy.org/bibtex/25335ea79e73f09228b4c1789ce3f156a/dblp},
booktitle = {SiPS},
crossref = {conf/sips/2021},
ee = {https://doi.org/10.1109/SiPS52927.2021.00051},
interhash = {3ff1e095c021d423a8ff9737be06dd59},
intrahash = {5335ea79e73f09228b4c1789ce3f156a},
isbn = {978-1-6654-0144-9},
keywords = {dblp},
pages = {1-3},
publisher = {IEEE},
timestamp = {2024-04-09T13:33:47.000+0200},
title = {Evaluation of Low-Voltage SRAM for Error-Resilient Augmented Reality Applications.},
url = {http://dblp.uni-trier.de/db/conf/sips/sips2021.html#WuKMB21},
year = 2021
}