%0 Conference Paper %1 conf/sips/WuKMB21 %A Wu, Tony F. %A Kim, Doyun %A Morris, Daniel H. %A Beigné, Edith %B SiPS %D 2021 %I IEEE %K dblp %P 1-3 %T Evaluation of Low-Voltage SRAM for Error-Resilient Augmented Reality Applications. %U http://dblp.uni-trier.de/db/conf/sips/sips2021.html#WuKMB21 %@ 978-1-6654-0144-9

@inproceedings{conf/sips/WuKMB21, added-at = {2021-11-17T00:00:00.000+0100}, author = {Wu, Tony F. and Kim, Doyun and Morris, Daniel H. and Beigné, Edith}, biburl = {https://www.bibsonomy.org/bibtex/25335ea79e73f09228b4c1789ce3f156a/dblp}, booktitle = {SiPS}, crossref = {conf/sips/2021}, ee = {https://doi.org/10.1109/SiPS52927.2021.00051}, interhash = {3ff1e095c021d423a8ff9737be06dd59}, intrahash = {5335ea79e73f09228b4c1789ce3f156a}, isbn = {978-1-6654-0144-9}, keywords = {dblp}, pages = {1-3}, publisher = {IEEE}, timestamp = {2024-04-09T13:33:47.000+0200}, title = {Evaluation of Low-Voltage SRAM for Error-Resilient Augmented Reality Applications.}, url = {http://dblp.uni-trier.de/db/conf/sips/sips2021.html#WuKMB21}, year = 2021 }