%0 Conference Paper %1 conf/vlsid/IchiharaKIN03 %A Ichihara, Hideyuki %A Kinoshita, Kozo %A Isodono, Koji %A Nishikawa, Shigeki %B VLSI Design %D 2003 %I IEEE Computer Society %K dblp %P 329-334 %T Channel Width Test Data Compression under a Limited Number of Test Inputs and Outputs. %U http://dblp.uni-trier.de/db/conf/vlsid/vlsid2003.html#IchiharaKIN03 %@ 0-7695-1868-0

@inproceedings{conf/vlsid/IchiharaKIN03, added-at = {2023-03-24T00:00:00.000+0100}, author = {Ichihara, Hideyuki and Kinoshita, Kozo and Isodono, Koji and Nishikawa, Shigeki}, biburl = {https://www.bibsonomy.org/bibtex/2d26f79e08e9d6d6b1743719f2c25677a/dblp}, booktitle = {VLSI Design}, crossref = {conf/vlsid/2003}, ee = {https://doi.ieeecomputersociety.org/10.1109/ICVD.2003.1183158}, interhash = {4591287f6e8d05c6ebdf60f2a43352c5}, intrahash = {d26f79e08e9d6d6b1743719f2c25677a}, isbn = {0-7695-1868-0}, keywords = {dblp}, pages = {329-334}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:18:49.000+0200}, title = {Channel Width Test Data Compression under a Limited Number of Test Inputs and Outputs.}, url = {http://dblp.uni-trier.de/db/conf/vlsid/vlsid2003.html#IchiharaKIN03}, year = 2003 }