%0 Conference Paper %1 conf/itc/ChenMN84 %A Chen, Harry H. %A Mathews, Robert G. %A Newkirk, John A. %B ITC %D 1984 %I IEEE Computer Society %K dblp %P 70-79 %T Test Generation for MOS Circuits. %U http://dblp.uni-trier.de/db/conf/itc/itc1984.html#ChenMN84

@inproceedings{conf/itc/ChenMN84, added-at = {2002-11-22T00:00:00.000+0100}, author = {Chen, Harry H. and Mathews, Robert G. and Newkirk, John A.}, biburl = {https://www.bibsonomy.org/bibtex/2318a7adacbc6628c70ebb656f195165e/dblp}, booktitle = {ITC}, crossref = {conf/itc/1984}, date = {2002-11-22}, description = {dblp}, interhash = {4c7f7175e71886034b77eb6a6ef7956c}, intrahash = {318a7adacbc6628c70ebb656f195165e}, keywords = {dblp}, pages = {70-79}, publisher = {IEEE Computer Society}, timestamp = {2002-11-22T00:00:00.000+0100}, title = {Test Generation for MOS Circuits.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc1984.html#ChenMN84}, year = 1984 }