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Disambiguation of "Chen, Harry H."

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Test Generation for MOS Circuits.

, , and . ITC, page 70-79. IEEE Computer Society, (1984)

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Walther Harry

Wolfram Harryers

Klaus-Peter Harry

Christoph Harryers

Fredrik Harrysson

 

Other publications of authors with the same name

Test Generation for MOS Circuits., , and . ITC, page 70-79. IEEE Computer Society, (1984)Beyond structural test, the rising need for system-level test.. VLSI-DAT, page 1-4. IEEE, (2018)An ISA-level Accurate Fault Simulator for System-level Fault Analysis., , , , , and . ATS, page 1-6. IEEE, (2020)Predicting system-level test and in-field customer failures using data mining., , , and . ITC, page 1-10. IEEE Computer Society, (2013)Comprehensive Quality and Reliability Management for Automotive Product., , , , and . IRPS, page 1-5. IEEE, (2020)System-level test coverage prediction by structural stress test data mining., , and . VLSI-DAT, page 1-4. IEEE, (2015)Vmin Prediction Using Nondestructive Stress Test., , , , and . VTS, page 1-7. IEEE, (2023)35.1 An Octa-Core 2.8/2GHz Dual-Gear Sensor-Assisted High-Speed and Power-Efficient CPU in 7nm FinFET 5G Smartphone SoC., , , , , , , , , and 10 other author(s). ISSCC, page 490-492. IEEE, (2021)Signal Reduction of Signature Blocks for Transient Fault Debugging., , , and . ATS, page 1-6. IEEE, (2023)Innovative Test Practices in Asia., , , , , , , , , and 3 other author(s). VTS, page 1. IEEE, (2020)