%0 Conference Paper %1 conf/irps/WangZZSCMBYGKBS19 %A Wang, Miaomiao %A Zhang, Jingyun %A Zhou, Huimei %A Southwick, Richard G. %A Chao, Robin Hsin Kuo %A Miao, Xin %A Basker, Veeraraghavan S. %A Yamashita, Tenko %A Guo, Dechao %A Karve, Gauri %A Bu, Huiming %A Stathis, James H. %B IRPS %D 2019 %I IEEE %K dblp %P 1-6 %T Bias Temperature Instability Reliability in Stacked Gate-All-Around Nanosheet Transistor. %U http://dblp.uni-trier.de/db/conf/irps/irps2019.html#WangZZSCMBYGKBS19 %@ 978-1-5386-9504-3

@inproceedings{conf/irps/WangZZSCMBYGKBS19, added-at = {2023-06-28T00:00:00.000+0200}, author = {Wang, Miaomiao and Zhang, Jingyun and Zhou, Huimei and Southwick, Richard G. and Chao, Robin Hsin Kuo and Miao, Xin and Basker, Veeraraghavan S. and Yamashita, Tenko and Guo, Dechao and Karve, Gauri and Bu, Huiming and Stathis, James H.}, biburl = {https://www.bibsonomy.org/bibtex/2df5948c8b58c1fbd57a544ded4895f4b/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2019}, ee = {https://doi.org/10.1109/IRPS.2019.8720573}, interhash = {51298dd7cb5f6a559e8a0209def9a2c3}, intrahash = {df5948c8b58c1fbd57a544ded4895f4b}, isbn = {978-1-5386-9504-3}, keywords = {dblp}, pages = {1-6}, publisher = {IEEE}, timestamp = {2024-04-10T16:55:06.000+0200}, title = {Bias Temperature Instability Reliability in Stacked Gate-All-Around Nanosheet Transistor.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2019.html#WangZZSCMBYGKBS19}, year = 2019 }