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Bias Temperature Instability Reliability in Stacked Gate-All-Around Nanosheet Transistor.

M. Wang, J. Zhang, H. Zhou, R. Southwick, R. Chao, X. Miao, V. Basker, T. Yamashita, D. Guo, G. Karve, H. Bu, and J. Stathis. IRPS, page 1-6. IEEE, (2019)

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Zhang Zhang

Meng Zhang

Methods and implementations of road-network matchingM. Zhang. TU München, (2009)

Shuying Zhang

Fuqing Zhang

Yong Zhang

Other publications of authors with the same name

A new technique for evaluating stacked nanosheet inner spacer TDDB reliability.T. Shen, K. Watanabe, H. Zhou, M. Belyansky, E. Stuckert, J. Zhang, A. Greene, V. Basker, and M. Wang. IRPS, page 1-5. IEEE, (2020)Enhanced neighborhood node graph neural networks for load forecasting in smart grid.Y. Jiang, M. Liu, Y. Li, L. Yaping, J. Zhang, Y. Liu, and C. Liu. Int. J. Mach. Learn. Cybern., 15 (1): 129-148 (January 2024)SiGe Gate-All-around Nanosheet Reliability.H. Zhou, M. Wang, R. Bao, C. Durfee, L. Qin, and J. Zhang. IRPS, page 60-1. IEEE, (2022)NetFPGA: Rapid Prototyping of Networking Devices in Open Source.N. Zilberman, Y. Audzevich, G. Kalogeridou, N. Bojan, J. Zhang, and A. Moore. SIGCOMM, page 363-364. ACM, (2015)FMM-Attack: A Flow-based Multi-modal Adversarial Attack on Video-based LLMs.J. Li, K. Gao, Y. Bai, J. Zhang, S. Xia, and Y. Wang. CoRR, (2024)Unsupervised Social Bot Detection via Structural Information Theory.H. Peng, J. Zhang, X. Huang, Z. Hao, A. Li, Z. Yu, and P. Yu. CoRR, (2024)RPG-Palm: Realistic Pseudo-data Generation for Palmprint Recognition.L. Shen, J. Jin, R. Zhang, H. Li, K. Zhao, Y. Zhang, J. Zhang, S. Ding, Y. Zhao, and W. Jia. ICCV, page 19548-19559. IEEE, (2023)Invertible Residual Rescaling Models.J. Li, T. Dai, Y. Zha, Y. Luo, L. Lu, B. Chen, Z. Wang, S. Xia, and J. Zhang. IJCAI, page 983-991. ijcai.org, (2024)Characterization and reliability of III-V gate-all-around MOSFETs.M. Si, S. Shin, N. Conrad, J. Gu, J. Zhang, M. Alam, and P. Ye. IRPS, page 4. IEEE, (2015)NetFPGA - rapid prototyping of high bandwidth devices in open source.N. Zilberman, Y. Audzevich, G. Kalogeridou, N. Bojan, J. Zhang, and A. Moore. FPL, page 1. IEEE, (2015)

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Disambiguation of "Zhang, Jingyun"

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Bias Temperature Instability Reliability in Stacked Gate-All-Around Nanosheet Transistor.

Please choose a person to relate this publication to

Zhang Zhang

Meng Zhang

Shuying Zhang

Fuqing Zhang

Yong Zhang

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Zhang, Jingyun"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Bias Temperature Instability Reliability in Stacked Gate-All-Around Nanosheet Transistor.

Please choose a person to relate this publication to

Zhang Zhang

Meng Zhang

Shuying Zhang

Fuqing Zhang

Yong Zhang

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
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Bias Temperature Instability Reliability in Stacked Gate-All-Around Nanosheet Transistor.