%0 Conference Paper %1 conf/dsn/PatelKHM19 %A Patel, Minesh %A Kim, Jeremie S. %A Hassan, Hasan %A Mutlu, Onur %B DSN %D 2019 %I IEEE %K dblp %P 13-25 %T Understanding and Modeling On-Die Error Correction in Modern DRAM: An Experimental Study Using Real Devices. %U http://dblp.uni-trier.de/db/conf/dsn/dsn2019.html#PatelKHM19 %@ 978-1-7281-0057-9

@inproceedings{conf/dsn/PatelKHM19, added-at = {2019-08-27T00:00:00.000+0200}, author = {Patel, Minesh and Kim, Jeremie S. and Hassan, Hasan and Mutlu, Onur}, biburl = {https://www.bibsonomy.org/bibtex/266c1a3f07c2d8e1318c9349a56f8f228/dblp}, booktitle = {DSN}, crossref = {conf/dsn/2019}, ee = {https://doi.org/10.1109/DSN.2019.00017}, interhash = {534124320a546bc0cebde9967adc780a}, intrahash = {66c1a3f07c2d8e1318c9349a56f8f228}, isbn = {978-1-7281-0057-9}, keywords = {dblp}, pages = {13-25}, publisher = {IEEE}, timestamp = {2019-10-17T12:48:40.000+0200}, title = {Understanding and Modeling On-Die Error Correction in Modern DRAM: An Experimental Study Using Real Devices.}, url = {http://dblp.uni-trier.de/db/conf/dsn/dsn2019.html#PatelKHM19}, year = 2019 }