%0 Conference Paper %1 conf/date/MedeirosGWFJTH20 %A Medeiros, Guilherme Cardoso %A Gürsoy, Cemil Cem %A Wu, Lizhou %A Fieback, Moritz %A Jenihhin, Maksim %A Taouil, Mottaqiallah %A Hamdioui, Said %B DATE %D 2020 %I IEEE %K dblp %P 792-797 %T A DFT Scheme to Improve Coverage of Hard-to-Detect Faults in FinFET SRAMs. %U http://dblp.uni-trier.de/db/conf/date/date2020.html#MedeirosGWFJTH20 %@ 978-3-9819263-4-7

@inproceedings{conf/date/MedeirosGWFJTH20, added-at = {2020-09-05T00:00:00.000+0200}, author = {Medeiros, Guilherme Cardoso and Gürsoy, Cemil Cem and Wu, Lizhou and Fieback, Moritz and Jenihhin, Maksim and Taouil, Mottaqiallah and Hamdioui, Said}, biburl = {https://www.bibsonomy.org/bibtex/2e5200c7cd79beda756735d6b0ea9a180/dblp}, booktitle = {DATE}, crossref = {conf/date/2020}, ee = {https://doi.org/10.23919/DATE48585.2020.9116278}, interhash = {65666d8eae7939398321b5bf97b28483}, intrahash = {e5200c7cd79beda756735d6b0ea9a180}, isbn = {978-3-9819263-4-7}, keywords = {dblp}, pages = {792-797}, publisher = {IEEE}, timestamp = {2024-10-07T08:13:41.000+0200}, title = {A DFT Scheme to Improve Coverage of Hard-to-Detect Faults in FinFET SRAMs.}, url = {http://dblp.uni-trier.de/db/conf/date/date2020.html#MedeirosGWFJTH20}, year = 2020 }