%0 Conference Paper %1 conf/irps/ZahedmaneshCZCB22 %A Zahedmanesh, Houman %A Ciofi, Ivan %A Zografos, Odysseas %A Croes, Kristof %A Badaroglu, Mustafa %B IRPS %D 2022 %I IEEE %K dblp %P 1-7 %T System-Level Simulation of Electromigration in a 3 nm CMOS Power Delivery Network: The Effect of Grid Redundancy, Metallization Stack and Standard-Cell Currents. %U http://dblp.uni-trier.de/db/conf/irps/irps2022.html#ZahedmaneshCZCB22 %@ 978-1-6654-7950-9

@inproceedings{conf/irps/ZahedmaneshCZCB22, added-at = {2022-05-09T00:00:00.000+0200}, author = {Zahedmanesh, Houman and Ciofi, Ivan and Zografos, Odysseas and Croes, Kristof and Badaroglu, Mustafa}, biburl = {https://www.bibsonomy.org/bibtex/29921fee8da0d66be6594edf6404f8c58/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2022}, ee = {https://doi.org/10.1109/IRPS48227.2022.9764511}, interhash = {684cc06ce5983c02f7ae053d4dad2605}, intrahash = {9921fee8da0d66be6594edf6404f8c58}, isbn = {978-1-6654-7950-9}, keywords = {dblp}, pages = {1-7}, publisher = {IEEE}, timestamp = {2024-04-09T12:18:58.000+0200}, title = {System-Level Simulation of Electromigration in a 3 nm CMOS Power Delivery Network: The Effect of Grid Redundancy, Metallization Stack and Standard-Cell Currents.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2022.html#ZahedmaneshCZCB22}, year = 2022 }