Author of the publication

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

System-Level Simulation of Electromigration in a 3 nm CMOS Power Delivery Network: The Effect of Grid Redundancy, Metallization Stack and Standard-Cell Currents.

H. Zahedmanesh, I. Ciofi, O. Zografos, K. Croes, and M. Badaroglu. IRPS, page 1-7. IEEE, (2022)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Sarah Ivanovas

Svilen Ivanov

Natalie Ivanits

Oxana Ivanova-Chessex

Elizaveta Ivanova

Other publications of authors with the same name

Methodology for extracting the characteristic capacitances of a power MOSFET transistor, using conventional on-wafer testing techniques.C. Kerner, I. Ciofi, T. Chiarella, and S. Huylenbroeck. ESSDERC, page 221-225. IEEE, (2012)Method to assess the impact of LER and spacing variation on BEOL dielectric reliability using 2D-field simulations for <20nm spacing.D. Kocaay, P. Roussel, K. Croes, I. Ciofi, A. Lesniewska, and I. Wolf. IRPS, page 10-1. IEEE, (2018)Exploring the Reliability Limits for the Z-Pitch Scaling of Molybdenum Inter-Word Line Oxides in 3D NAND.D. Tiernc, A. Arreghini, A. Lesniewska, Y. Jeong, M. van der Veen, J. Stiers, N. Bazzazian, I. Ciofi, G. den Bosch, and M. Rosmeulen. IRPS, page 1-5. IEEE, (2024)A pragmatic network-aware paradigm for system-level electromigration predictions at scale.H. Zahedmanesh, P. Roussel, I. Ciofi, and K. Croes. IRPS, page 1-6. IEEE, (2023)A Novel System-Level Physics-Based Electromigration Modelling Framework: Application to the Power Delivery Network.H. Zahedmanesh, I. Ciofi, O. Zografos, M. Badaroglu, and K. Croes. SLIP, page 1-7. IEEE, (2021)De-Coupling Thermo-Migration from Electromigration Using a Dedicated Test Structure.O. Pedreira, Y. Ding, D. Coenen, P. Roussel, A. Saleh, V. Simons, H. Zahedmanesh, I. Ciofi, and K. Croes. IRPS, page 1-5. IEEE, (2024)Challenges for Interconnect Reliability: From Element to System Level.O. Pedreira, H. Zahedmanesh, Y. Ding, I. Ciofi, and K. Croes. ISPD, page 106. ACM, (2023)Metodi e strumentazione per la caratterizzazione di interconnessioni VLSI.I. Ciofi. University of Pisa, Italy, (2001)Impact of process variability on BEOL TDDB lifetime model assessment.K. Croes, D. Kocaay, I. Ciofi, J. Bömmels, and Z. Tökei. IRPS, page 5. IEEE, (2015)Circuit and process co-design with vertical gate-all-around nanowire FET technology to extend CMOS scaling for 5nm and beyond technologies.T. Bao, D. Yakimets, J. Ryckaert, I. Ciofi, R. Baert, A. Veloso, J. Bömmels, N. Collaert, P. Roussel, S. Demuynck and 6 other author(s). ESSDERC, page 102-105. IEEE, (2014)

BibSonomy

Disambiguation of "Ciofi, Ivan"