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%0 Conference Paper
%1 conf/irps/LeurquinVVGESDI22
%A Leurquin, Camille
%A Vandendaele, William
%A Viey, Aby-Gaël
%A Gwoziecki, Romain
%A Escoffier, René
%A Salot, R.
%A Despesse, Ghislain
%A Iucolano, Ferdinando
%A Modica, Roberto
%A Constant, Aurore
%B IRPS
%D 2022
%I IEEE
%K dblp
%P 10
%T Novel High Voltage Bias Temperature Instabilities (HV-BTI) setup to monitor RON/VTH drift on GaN-on-Si E-mode MOSc-HEMTs under drain voltage.
%U http://dblp.uni-trier.de/db/conf/irps/irps2022.html#LeurquinVVGESDI22
%@ 978-1-6654-7950-9
@inproceedings{conf/irps/LeurquinVVGESDI22,
added-at = {2024-07-08T00:00:00.000+0200},
author = {Leurquin, Camille and Vandendaele, William and Viey, Aby-Gaël and Gwoziecki, Romain and Escoffier, René and Salot, R. and Despesse, Ghislain and Iucolano, Ferdinando and Modica, Roberto and Constant, Aurore},
biburl = {https://www.bibsonomy.org/bibtex/254de4f05ae7b6e411279d1fafa0dc2ec/dblp},
booktitle = {IRPS},
crossref = {conf/irps/2022},
ee = {https://doi.org/10.1109/IRPS48227.2022.9764482},
interhash = {6a6f0eca4cfa40c97484aa45b52f0b71},
intrahash = {54de4f05ae7b6e411279d1fafa0dc2ec},
isbn = {978-1-6654-7950-9},
keywords = {dblp},
pages = 10,
publisher = {IEEE},
timestamp = {2024-07-15T07:17:46.000+0200},
title = {Novel High Voltage Bias Temperature Instabilities (HV-BTI) setup to monitor RON/VTH drift on GaN-on-Si E-mode MOSc-HEMTs under drain voltage.},
url = {http://dblp.uni-trier.de/db/conf/irps/irps2022.html#LeurquinVVGESDI22},
year = 2022
}