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%0 Conference Paper
%1 conf/irps/RodriguezCMNAMB20
%A Rodríguez, Rosana
%A Crespo-Yepes, Albert
%A Martín-Martínez, Javier
%A Nafría, Montserrat
%A Aragonès, Xavier
%A Mateo, Diego
%A Barajas, Enrique
%B IRPS
%D 2020
%I IEEE
%K dblp
%P 1-7
%T Experimental Monitoring of Aging in CMOS RF Linear Power Amplifiers: Correlation Between Device and Circuit Degradation.
%U http://dblp.uni-trier.de/db/conf/irps/irps2020.html#RodriguezCMNAMB20
%@ 978-1-7281-3199-3
@inproceedings{conf/irps/RodriguezCMNAMB20,
added-at = {2024-05-07T00:00:00.000+0200},
author = {Rodríguez, Rosana and Crespo-Yepes, Albert and Martín-Martínez, Javier and Nafría, Montserrat and Aragonès, Xavier and Mateo, Diego and Barajas, Enrique},
biburl = {https://www.bibsonomy.org/bibtex/280f9d1ffea4e83933e9520718a67bd9e/dblp},
booktitle = {IRPS},
crossref = {conf/irps/2020},
ee = {https://doi.org/10.1109/IRPS45951.2020.9129301},
interhash = {6aa53a76506a67b41cd5224b7f81dfd6},
intrahash = {80f9d1ffea4e83933e9520718a67bd9e},
isbn = {978-1-7281-3199-3},
keywords = {dblp},
pages = {1-7},
publisher = {IEEE},
timestamp = {2024-05-13T09:41:10.000+0200},
title = {Experimental Monitoring of Aging in CMOS RF Linear Power Amplifiers: Correlation Between Device and Circuit Degradation.},
url = {http://dblp.uni-trier.de/db/conf/irps/irps2020.html#RodriguezCMNAMB20},
year = 2020
}