%0 Conference Paper %1 conf/irps/RodriguezCMNAMB20 %A Rodríguez, Rosana %A Crespo-Yepes, Albert %A Martín-Martínez, Javier %A Nafría, Montserrat %A Aragonès, Xavier %A Mateo, Diego %A Barajas, Enrique %B IRPS %D 2020 %I IEEE %K dblp %P 1-7 %T Experimental Monitoring of Aging in CMOS RF Linear Power Amplifiers: Correlation Between Device and Circuit Degradation. %U http://dblp.uni-trier.de/db/conf/irps/irps2020.html#RodriguezCMNAMB20 %@ 978-1-7281-3199-3

@inproceedings{conf/irps/RodriguezCMNAMB20, added-at = {2024-05-07T00:00:00.000+0200}, author = {Rodríguez, Rosana and Crespo-Yepes, Albert and Martín-Martínez, Javier and Nafría, Montserrat and Aragonès, Xavier and Mateo, Diego and Barajas, Enrique}, biburl = {https://www.bibsonomy.org/bibtex/280f9d1ffea4e83933e9520718a67bd9e/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2020}, ee = {https://doi.org/10.1109/IRPS45951.2020.9129301}, interhash = {6aa53a76506a67b41cd5224b7f81dfd6}, intrahash = {80f9d1ffea4e83933e9520718a67bd9e}, isbn = {978-1-7281-3199-3}, keywords = {dblp}, pages = {1-7}, publisher = {IEEE}, timestamp = {2024-05-13T09:41:10.000+0200}, title = {Experimental Monitoring of Aging in CMOS RF Linear Power Amplifiers: Correlation Between Device and Circuit Degradation.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2020.html#RodriguezCMNAMB20}, year = 2020 }