%0 Conference Paper %1 conf/ets/GhermanEB12 %A Gherman, Valentin %A Evain, Samuel %A Bonhomme, Yannick %B European Test Symposium %D 2012 %I IEEE Computer Society %K dblp %P 1-6 %T Memory reliability improvements based on maximized error-correcting codes. %U http://dblp.uni-trier.de/db/conf/ets/ets2012.html#GhermanEB12 %@ 978-1-4673-0697-3

@inproceedings{conf/ets/GhermanEB12, added-at = {2017-05-22T00:00:00.000+0200}, author = {Gherman, Valentin and Evain, Samuel and Bonhomme, Yannick}, biburl = {https://www.bibsonomy.org/bibtex/2bfed1d7ad4c29fb7444c0be56f79471f/dblp}, booktitle = {European Test Symposium}, crossref = {conf/ets/2012}, ee = {https://doi.org/10.1109/ETS.2012.6233018}, interhash = {6abeb82d9affa0ba4529d14fcc6e2020}, intrahash = {bfed1d7ad4c29fb7444c0be56f79471f}, isbn = {978-1-4673-0697-3}, keywords = {dblp}, pages = {1-6}, publisher = {IEEE Computer Society}, timestamp = {2019-10-17T15:59:26.000+0200}, title = {Memory reliability improvements based on maximized error-correcting codes.}, url = {http://dblp.uni-trier.de/db/conf/ets/ets2012.html#GhermanEB12}, year = 2012 }