%0 Journal Article %1 journals/et/BasuSCB02 %A Basu, Subhayu %A Sengupta, Indranil %A Chowdhury, Dipanwita Roy %A Bhawmik, Sudipta %D 2002 %J J. Electron. Test. %K dblp %N 4-5 %P 475-485 %T An Integrated Approach to Testing Embedded Cores and Interconnects Using Test Access Mechanism (TAM) Switch. %U http://dblp.uni-trier.de/db/journals/et/et18.html#BasuSCB02 %V 18

@article{journals/et/BasuSCB02, added-at = {2020-09-11T00:00:00.000+0200}, author = {Basu, Subhayu and Sengupta, Indranil and Chowdhury, Dipanwita Roy and Bhawmik, Sudipta}, biburl = {https://www.bibsonomy.org/bibtex/2d15dff3d85a33a3421b85cc861e7b4f3/dblp}, ee = {https://doi.org/10.1023/A:1016549725661}, interhash = {6c145976a13ed7db9bdcaa1d430a441b}, intrahash = {d15dff3d85a33a3421b85cc861e7b4f3}, journal = {J. Electron. Test.}, keywords = {dblp}, number = {4-5}, pages = {475-485}, timestamp = {2020-09-12T11:40:15.000+0200}, title = {An Integrated Approach to Testing Embedded Cores and Interconnects Using Test Access Mechanism (TAM) Switch.}, url = {http://dblp.uni-trier.de/db/journals/et/et18.html#BasuSCB02}, volume = 18, year = 2002 }