%0 Conference Paper %1 conf/vlsid/BasuMRSB02 %A Basu, Subhayu %A Mukhopadhyay, Debdeep %A Chowdhury, Dipanwita Roy %A Sengupta, Indranil %A Bhawmik, Sudipta %B ASP-DAC/VLSI Design %D 2002 %I IEEE Computer Society %K dblp %P 598-603 %T Reformatting Test Patterns for Testing Embedded Core Based System Using Test Access Mechanism (TAM) Switch. %U http://dblp.uni-trier.de/db/conf/vlsid/vlsid2002.html#BasuMRSB02 %@ 0-7695-1299-2

@inproceedings{conf/vlsid/BasuMRSB02, added-at = {2022-11-14T00:00:00.000+0100}, author = {Basu, Subhayu and Mukhopadhyay, Debdeep and Chowdhury, Dipanwita Roy and Sengupta, Indranil and Bhawmik, Sudipta}, biburl = {https://www.bibsonomy.org/bibtex/2e143dac32118d630ef815c23c6af6bf7/dblp}, booktitle = {ASP-DAC/VLSI Design}, crossref = {conf/vlsid/2002}, ee = {https://dl.acm.org/doi/10.5555/832284.835396}, interhash = {72fcf77cacd09ba6cb7b4a90e2467d29}, intrahash = {e143dac32118d630ef815c23c6af6bf7}, isbn = {0-7695-1299-2}, keywords = {dblp}, pages = {598-603}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T01:05:13.000+0200}, title = {Reformatting Test Patterns for Testing Embedded Core Based System Using Test Access Mechanism (TAM) Switch.}, url = {http://dblp.uni-trier.de/db/conf/vlsid/vlsid2002.html#BasuMRSB02}, year = 2002 }