%0 Journal Article %1 journals/jim/ChangLCJ11 %A Chang, Chuan-Yu %A Li, ChunHsi %A Chang, Yung-Chi %A Jeng, MuDer %D 2011 %J J. Intell. Manuf. %K dblp %N 6 %P 953-964 %T Wafer defect inspection by neural analysis of region features. %U http://dblp.uni-trier.de/db/journals/jim/jim22.html#ChangLCJ11 %V 22

@article{journals/jim/ChangLCJ11, added-at = {2020-09-24T00:00:00.000+0200}, author = {Chang, Chuan-Yu and Li, ChunHsi and Chang, Yung-Chi and Jeng, MuDer}, biburl = {https://www.bibsonomy.org/bibtex/2d2f032514e652d3a19709c50b86e74be/dblp}, ee = {https://doi.org/10.1007/s10845-009-0369-4}, interhash = {17cb033d6d9dd72d0d3442fa7052128b}, intrahash = {d2f032514e652d3a19709c50b86e74be}, journal = {J. Intell. Manuf.}, keywords = {dblp}, number = 6, pages = {953-964}, timestamp = {2020-09-25T11:43:17.000+0200}, title = {Wafer defect inspection by neural analysis of region features.}, url = {http://dblp.uni-trier.de/db/journals/jim/jim22.html#ChangLCJ11}, volume = 22, year = 2011 }