%0 Journal Article %1 journals/tvlsi/KookCC13 %A Kook, Sehun %A Choi, Hyun Woo %A Chatterjee, Abhijit %D 2013 %J IEEE Trans. Very Large Scale Integr. Syst. %K dblp %N 3 %P 454-464 %T Low-Resolution DAC-Driven Linearity Testing of Higher Resolution ADCs Using Polynomial Fitting Measurements. %U http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi21.html#KookCC13 %V 21

@article{journals/tvlsi/KookCC13, added-at = {2020-03-11T00:00:00.000+0100}, author = {Kook, Sehun and Choi, Hyun Woo and Chatterjee, Abhijit}, biburl = {https://www.bibsonomy.org/bibtex/23723a01588a65342df7c40f04b4ce069/dblp}, ee = {https://doi.org/10.1109/TVLSI.2012.2190433}, interhash = {858859df6401ed4e00d2bc4ecd8fa591}, intrahash = {3723a01588a65342df7c40f04b4ce069}, journal = {IEEE Trans. Very Large Scale Integr. Syst.}, keywords = {dblp}, number = 3, pages = {454-464}, timestamp = {2020-03-12T11:45:11.000+0100}, title = {Low-Resolution DAC-Driven Linearity Testing of Higher Resolution ADCs Using Polynomial Fitting Measurements.}, url = {http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi21.html#KookCC13}, volume = 21, year = 2013 }