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Low-Resolution DAC-Driven Linearity Testing of Higher Resolution ADCs Using Polynomial Fitting Measurements.

, , и . IEEE Trans. Very Large Scale Integr. Syst., 21 (3): 454-464 (2013)

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Woo-Hyun Chung

Hyun Woo Won

Woo-Hyun Yoon

Hyun-Woo Park

Hyun-Beom Choi

 

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