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%0 Conference Paper
%1 conf/itc/SodenFH90
%A Soden, Jerry M.
%A Fritzemeier, Ronald R.
%A Hawkins, Charles F.
%B ITC
%D 1990
%I IEEE Computer Society
%K dblp
%P 255-256
%T Zero defects or zero stuck-at faults-CMOS IC process improvement with IDDQ.
%U http://dblp.uni-trier.de/db/conf/itc/itc1990.html#SodenFH90
%@ 0-8186-9064-X
@inproceedings{conf/itc/SodenFH90,
added-at = {2023-03-23T00:00:00.000+0100},
author = {Soden, Jerry M. and Fritzemeier, Ronald R. and Hawkins, Charles F.},
biburl = {https://www.bibsonomy.org/bibtex/2193b76bd7154eff7ef07bcf8c0c53173/dblp},
booktitle = {ITC},
crossref = {conf/itc/1990},
ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.1990.114026},
interhash = {8afcedd7dbdd6e925a5f7460e5550c45},
intrahash = {193b76bd7154eff7ef07bcf8c0c53173},
isbn = {0-8186-9064-X},
keywords = {dblp},
pages = {255-256},
publisher = {IEEE Computer Society},
timestamp = {2024-04-10T19:52:40.000+0200},
title = {Zero defects or zero stuck-at faults-CMOS IC process improvement with IDDQ.},
url = {http://dblp.uni-trier.de/db/conf/itc/itc1990.html#SodenFH90},
year = 1990
}