%0 Conference Paper %1 conf/vlsi-dat/TangTCBH15 %A Tang, Huaxing %A Tai, Ting-Pu %A Cheng, Wu-Tung %A Benware, Brady %A Hapke, Friedrich %B VLSI-DAT %D 2015 %I IEEE %K dblp %P 1-4 %T Diagnosing timing related cell internal defects for FinFET technology. %U http://dblp.uni-trier.de/db/conf/vlsi-dat/vlsi-dat2015.html#TangTCBH15 %@ 978-1-4799-6275-4

@inproceedings{conf/vlsi-dat/TangTCBH15, added-at = {2015-09-28T00:00:00.000+0200}, author = {Tang, Huaxing and Tai, Ting-Pu and Cheng, Wu-Tung and Benware, Brady and Hapke, Friedrich}, biburl = {https://www.bibsonomy.org/bibtex/2d20c7ee2a14da03a98fa6a6fbcdc4823/dblp}, booktitle = {VLSI-DAT}, crossref = {conf/vlsi-dat/2015}, ee = {http://dx.doi.org/10.1109/VLSI-DAT.2015.7114547}, interhash = {8cf11012cc8c6c2a8dbe1d9e60075381}, intrahash = {d20c7ee2a14da03a98fa6a6fbcdc4823}, isbn = {978-1-4799-6275-4}, keywords = {dblp}, pages = {1-4}, publisher = {IEEE}, timestamp = {2015-09-29T11:36:26.000+0200}, title = {Diagnosing timing related cell internal defects for FinFET technology.}, url = {http://dblp.uni-trier.de/db/conf/vlsi-dat/vlsi-dat2015.html#TangTCBH15}, year = 2015 }